发明名称 Arm type three-dimensional measuring apparatus and deflection correction method in arm type three-dimensional measuring apparatus
摘要 An arm type three-dimensional measuring apparatus includes: a multi-jointed arm mechanism including a probe in a distal end; a processing part for computing a position of the probe, the probe being manually moved; a sensor which is formed in each axis of the multi-jointed arm mechanism and detects at least a force in one predetermined direction and torques in two predetermined axial directions generated in an attitude state of the multi-jointed arm mechanism, wherein the processing part computes a deflection amount in each axis of the multi-jointed arm mechanism based on an output of the sensor and sequentially computes a position of the probe based on the deflection amount.
申请公布号 US9366592(B2) 申请公布日期 2016.06.14
申请号 US201414546356 申请日期 2014.11.18
申请人 MITUTOYO CORPORATION 发明人 Goto Tomonori
分类号 G01B5/008;G01L5/16;G01B21/04;G01L5/22 主分类号 G01B5/008
代理机构 Oliff PLC 代理人 Oliff PLC
主权项 1. An arm type three-dimensional measuring apparatus comprising: a multi-jointed arm mechanise including a probe in a distal end; a processing part for computing a position of the probe, the probe being manually moved; a sensor which is formed in each axis of the multi-jointed arm mechanism and detects at least a force in one predetermined direction and torques in two predetermined axial directions generated in an attitude state of the multi-jointed arm mechanism, wherein the processing part computes a deflection amount in each axis of the multi-jointed arm mechanism based on an output of the sensor and sequentially computes a position of the probe based on the deflection amount.
地址 Kanagawa JP