发明名称 |
Arm type three-dimensional measuring apparatus and deflection correction method in arm type three-dimensional measuring apparatus |
摘要 |
An arm type three-dimensional measuring apparatus includes: a multi-jointed arm mechanism including a probe in a distal end; a processing part for computing a position of the probe, the probe being manually moved; a sensor which is formed in each axis of the multi-jointed arm mechanism and detects at least a force in one predetermined direction and torques in two predetermined axial directions generated in an attitude state of the multi-jointed arm mechanism, wherein the processing part computes a deflection amount in each axis of the multi-jointed arm mechanism based on an output of the sensor and sequentially computes a position of the probe based on the deflection amount. |
申请公布号 |
US9366592(B2) |
申请公布日期 |
2016.06.14 |
申请号 |
US201414546356 |
申请日期 |
2014.11.18 |
申请人 |
MITUTOYO CORPORATION |
发明人 |
Goto Tomonori |
分类号 |
G01B5/008;G01L5/16;G01B21/04;G01L5/22 |
主分类号 |
G01B5/008 |
代理机构 |
Oliff PLC |
代理人 |
Oliff PLC |
主权项 |
1. An arm type three-dimensional measuring apparatus comprising:
a multi-jointed arm mechanise including a probe in a distal end; a processing part for computing a position of the probe, the probe being manually moved; a sensor which is formed in each axis of the multi-jointed arm mechanism and detects at least a force in one predetermined direction and torques in two predetermined axial directions generated in an attitude state of the multi-jointed arm mechanism, wherein the processing part computes a deflection amount in each axis of the multi-jointed arm mechanism based on an output of the sensor and sequentially computes a position of the probe based on the deflection amount. |
地址 |
Kanagawa JP |