发明名称 |
Semiconductor device and method for fabricating the same |
摘要 |
A semiconductor device includes a fully silicided first gate interconnect formed on a semiconductor substrate, a first sidewall formed on a side of the first gate interconnect, and impurity diffusion layers formed in an active region of the semiconductor substrate. A shared contact plug is formed in an interlayer dielectric formed on the semiconductor substrate so as to be connected to the first gate interconnect and associated one of the impurity diffusion layers. The first gate interconnect is formed, at its part connected to the shared contact plug, with a projection part projecting beyond the first sidewall.
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申请公布号 |
US2007096212(A1) |
申请公布日期 |
2007.05.03 |
申请号 |
US20060583846 |
申请日期 |
2006.10.20 |
申请人 |
SATO YOSHIHIRO;OGAWA HISASHI |
发明人 |
SATO YOSHIHIRO;OGAWA HISASHI |
分类号 |
H01L27/12;H01L21/4763;H01L27/01;H01L31/0392 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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