| 摘要 |
<p>A test apparatus for testing a device under test comprises a pattern memory for storing a test instruction series defining a test sequence for testing the device under test, a section register for storing a repetition section in response to specification of a repetition section representing at least one instruction to be repetitively executed in the test instruction series, an instruction cache for caching the test instruction series read out of the pattern memory, a memory control unit for reading the test instruction series from the pattern memory and writing it in an instruction cache, a pattern generating unit for reading instructions included in the test instruction series one by one from the instruction cache, executing the instructions one by one, and generating a test pattern corresponding to the executed instructions, and a signal output unit for generating a test signal from the test pattern and supplying it to the device under test. The pattern generating unit repetitively executes the instruction series in the repetition section in the test instruction series when the repetition section is stored in the section register.</p> |
