发明名称 |
RESIST COMPOSITION AND PRODUCTION METHOD OF RESIST PATTERN |
摘要 |
PROBLEM TO BE SOLVED: To provide a resist composition from which a resist pattern can be produced with good line edge roughness (LER).SOLUTION: The resist composition comprises: a resin having a structural unit represented by formula (I) and a structural unit having an acid-labile group; and an acid generator represented by formula (B1). In the formulae, Rrepresents a hydrogen atom or a methyl group; Rrepresents a hydrocarbon group; Arepresents a divalent hydrocarbon group or the like; Qand Qrepresent a fluorine atom or a perfluoroalkyl group; Lrepresents a divalent saturated hydrocarbon in which -CH- included in the group may be replaced by -O- or -CO- and a hydrogen atom in the group may be replaced by a fluorine atom or a hydroxy group; Y represents an alkyl group or an alicyclic hydrocarbon group optionally having a substituent, in which -CH- included in the group may be replaced by -O- or the like; and Zrepresents an organic cation.SELECTED DRAWING: None |
申请公布号 |
JP2016153881(A) |
申请公布日期 |
2016.08.25 |
申请号 |
JP20160019568 |
申请日期 |
2016.02.04 |
申请人 |
SUMITOMO CHEMICAL CO LTD |
发明人 |
MASUYAMA TATSURO;YAMAMOTO SATOSHI;ICHIKAWA KOJI |
分类号 |
G03F7/004;C08F220/26;G03F7/039;G03F7/20 |
主分类号 |
G03F7/004 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|