发明名称 |
INSPECTION DEVICE AND INSPECTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To efficiently improve a manufacturing line by detecting a failure in an early stage.SOLUTION: An inspection device includes an irradiation part, an imaging part, and a control part. The irradiation part irradiates an inspection area which is a part of an area to which an organic material is applied in a substrate to which the organic material is applied by an ink jet system and extended in a direction crossing an application direction by the ink jet system with light. The imaging part images the inspection area irradiated with the light. The control part detects the failure of the substrate on the basis of a captured image captured by the imaging part.SELECTED DRAWING: Figure 6 |
申请公布号 |
JP2016090287(A) |
申请公布日期 |
2016.05.23 |
申请号 |
JP20140221881 |
申请日期 |
2014.10.30 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
ONOE KOTARO;OSHIMA KIYOMI;HAYASHI TERUYUKI;YAHIRO SHUNICHI |
分类号 |
G01N21/956;B05C5/00;B05C11/00;B05D1/26;B05D3/00;H01L51/50;H05B33/12 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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