发明名称 Semiconductor memory device and operating method thereof
摘要 A method of operating a semiconductor memory device includes performing a first program operation to simultaneously increase threshold voltages of memory cells having different target levels to sub-levels lower than the different target levels, verifying the memory cells by using different verify voltages, respectively, performing a second program operation to divide the threshold voltages of the memory cells, and performing a third program operation to increase the threshold voltages of the memory cells to the different target levels, respectively.
申请公布号 US9478304(B2) 申请公布日期 2016.10.25
申请号 US201514592672 申请日期 2015.01.08
申请人 SK Hynix Inc. 发明人 Park Min Sang;Lee Yun Bong;Park Suk Kwang;Huh Hwang;Lee Dong Wook;Kim Myung Su;Cho Sung Hoon;Lee Sang Jo;Sunwoo Chang Jin;Choi Gil Bok
分类号 G11C16/34;G11C16/10;G11C16/26;G11C16/04;G11C11/56 主分类号 G11C16/34
代理机构 I P & T Group LLP 代理人 I P & T Group LLP
主权项 1. A method of operating a semiconductor memory device, the method comprising: performing a first program operation to simultaneously increase threshold voltages of memory cells having different target program levels to sub-levels lower than the different target program levels, by applying a first program pulse once to a selected word line coupled to the memory cells to be programmed, without a verify operation; verifying the memory cells by using different verify voltages, respectively; performing a second program operation to divide the threshold voltages of the memory cells; and performing a third program operation to increase the threshold voltages of the memory cells to the different target program levels, respectively.
地址 Gyeonggi-do KR