发明名称 METHODS FOR ALTERING ONE OR MORE PARAMETERS OF A MEASUREMENTSYSTEM
摘要 Methods for altering one or more parameters of a measurement system are provided. One method includes analyzing a sample using the system to generat e values from classification channels of the system for a population of particles in the sample. The method also includes identifying a region in a classification space in which the values for the populations are located. In addition, the method includes determining an optimized classification region for the population using one or more properties of the region. The optimized classification region contains a predetermined percentage of the values for the population. The optimized classification region is used for classificati on of particles in additional samples.
申请公布号 CA2552872(A1) 申请公布日期 2005.08.04
申请号 CA20052552872 申请日期 2005.01.07
申请人 LUMINEX CORPORATION 发明人 CALVIN, EDWARD
分类号 G01N15/14;G06K9/00;G06K9/62 主分类号 G01N15/14
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