发明名称 |
Method and system for measuring a coating thickness |
摘要 |
<p>A method of measuring a coating thickness involves projecting a pattern of light on a surface (step A). A first reflection of the pattern of light is received by a first image capturing device. A second reflection of the pattern of light is received by an image capturing device which may be the same or a different image capturing device. The first reflection is compared with the second reflection (step B). A first data map of the surface is created by comparing the first reflection and the second reflection (step C). A coating is deposited on the surface (step D). A second data map of the surface with the coating is created by comparing reflections (step E). The first data map and the second data map are then compared to determine a thickness of the coating (step F). A system for carrying out the method is also disclosed.</p> |
申请公布号 |
EP2131144(A1) |
申请公布日期 |
2009.12.09 |
申请号 |
EP20090250805 |
申请日期 |
2009.03.23 |
申请人 |
UNITED TECHNOLOGIES CORPORATION |
发明人 |
BOYER, JESSE R.;JOYNER, RANDALL W.;ALLOCCA, GENE P.;PEARSON, JEFFRY K. |
分类号 |
G01B11/06;B28B17/00;G01B11/25 |
主分类号 |
G01B11/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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