| 摘要 |
A system may perform interconnect BIST (IBIST) testing on source synchronous links. More particularly, the system may perform, at normal operating frequency for the source synchronous link, a source synchronous link test that tests a victim line on the source synchronous link using a transition weave pattern. The transition weave pattern causes interaction between a data transition on the victim line, previous transitions on the victim line, and transitions on the other lines of the link (the "aggressor" lines). The interaction caused may be: (i) a first crossing pulse on the victim line; (ii) a second crossing pulse of the opposite polarity on each aggressor line concurrent with the first crossing pulse on the victim line; and (iii) a reflection in the opposite direction of the first transition of the first crossing pulse, wherein the reflection results from a previous transition on the victim line. Additionally, in one embodiment, the system may perform repeated iterations of the transition weave pattern while varying the timing of the previous transition on the victim line (to create the reflection) with respect to the first crossing pulse on the victim line. |
