SYSTEM FOR MEASURING THREE-DIMENSIONAL PROFILE OF TRANSPARENT OBJECT OR REFRACTIVE INDEX BY FRINGE PROJECTION

摘要

A system for measuring the profile or the refractive index of a transparent object by fringe projection techniques is provided and has an image generating device, an image capture device, and an image processor. The image generating device produces a reference image with a long depth of focus. This reference image is emitted into an inspected transparent object, and is distorted by the refractive index and the profile of the transparent object. The image capture device receives the distorted image. The image processor analyzes the difference between the distorted image and the reference image, so as to identify the profile or the refractive index of the inspected transparent object.

主权项

1. A system for measuring a transparent object by fringe projection, measuring a profile or refractive index of an inspected transparent object, the system comprising:
a long depth of focus (DOF) image generating device generating a long DOF image, wherein the long DOF image is emitted into the inspected transparent object; an image capture device receiving a distorted image which is generated by the long DOF image emitted into the inspected transparent object and then refracted therefrom; and an image processor electrically connected to the image capture device, wherein the image processor pre-stores the long DOF image, wherein the image processor analyzes the distorted image and compares the distorted image with the long DOF image, so as to identify the profile or refractive index of the inspected transparent object.