发明名称 Method for manufacturing semiconductor device having a multi-layer interconnection
摘要 A semiconductor device including a semiconductor substrate, and a plurality of first interconnects formed over the semiconductor substrate. A first insulating layer covers the plurality of first interconnects, and a second insulating layer is formed between the plurality of first interconnects. The second insulating layer has substantially the same height as the plurality of first interconnects. An intermediate insulating layer is formed over the second insulating layer.
申请公布号 US6475901(B2) 申请公布日期 2002.11.05
申请号 US20010984321 申请日期 2001.10.29
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 NISHIMURA HIDETOMO;NAKAMURA MAKIKO
分类号 H01L21/302;H01L21/3065;H01L21/316;H01L21/3205;H01L21/60;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L21/302
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