发明名称 SPECTRAL PURITY FILTER, RADIATION SOURCE, LITHOGRAPHIC APPARATUS, AND DEVICE MANUFACTURING METHOD
摘要 According to an aspect of the present invention, a spectral purity filter includes an aperture, the aperture being arranged to diffract a first wavelength of radiation and to allow at least a portion of a second wavelength of radiation to be transmitted through the aperture, the second wavelength of radiation being shorter than the first wavelength of radiation, wherein the aperture has a diameter greater than 20μm.
申请公布号 KR20110039457(A) 申请公布日期 2011.04.18
申请号 KR20117003201 申请日期 2009.07.09
申请人 ASML NETHERLANDS B.V. 发明人 JAK MARTIN JACOBUS JOHAN;SOER WOUTER ANTHON;VAN HERPEN MAARTEN MARINUS JOHANNES WILHELMUS;BANINE VADIM YEVGENYEVICH;YAKUNIN ANDREI MIKHAILOVICH
分类号 G03F7/20;G02B5/20 主分类号 G03F7/20
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