VOLTAGE CLAMPING CIRCUIT, SEMICONDUCTOR DEVICE USING IT, OVERCURRENT PROTECTION CIRCUIT, VOLTAGE MEASUREMENT PROBE, VOLTAGE MEASUREMENT INSTRUMENT, AND SEMICONDUCTOR EVALUATION DEVICE
摘要
<P>PROBLEM TO BE SOLVED: To provide a voltage clamping circuit having quick response speed. <P>SOLUTION: The voltage clamping circuit 1 includes: connecting the drain of a normally on type field effect transistor 8 having a negative threshold voltage (-2V) to an input node N8; connecting the source to an output node 9 to be grounded through a resistant element 9; giving the output voltage (2V) of a variable direct current power source 10 to the gate; restricting the output voltage Vout in Vc or less since the field effect transistor 8 is switched off when the voltage Vout of an output node N9 is higher than a clamp voltage Vc(=4V) by voltage lowering of the resistant element 9; and thus accelerating the response speed rather than the conventional voltage clamping circuit using diodes or the like. <P>COPYRIGHT: (C)2009,JPO&INPIT
