Modular data storage device testing system

摘要

A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port portion of the test deck and subsequently replace a tested data storage component housed within the first test deck with an untested data storage component.

主权项

1. A method comprising:
providing a test slot, a loader assembly, and an exchange assembly arranged in a testing system; opening an access port portion of a test deck with the exchange assembly; replacing a first individual data storage component with a second individual data storage component with the exchange assembly; closing the access port portion of the test deck with the exchange assembly; engaging the test deck with a test slot with the loader assembly; and conducting a data component test with the test deck and test slot.