发明名称 Pattern forming method
摘要 A first resist film is formed on a substrate, and first pattern exposure is performed such that the first resist film is irradiated with exposure light through a first mask. Then, the first resist film is developed, thereby forming a first resist pattern out of the first resist film. Subsequently, a nano-carbon material is attached to the surface of the first resist pattern, and then a second resist film is formed on the substrate including the first resist pattern. Thereafter, second pattern exposure is performed such that the second resist film is irradiated with exposure light through a second mask. Then, the second resist film is developed, thereby forming a second resist pattern out of the second resist film.
申请公布号 US7998658(B2) 申请公布日期 2011.08.16
申请号 US20100767369 申请日期 2010.04.26
申请人 PANASONIC CORPORATION 发明人 ENDOU MASAYUKI;SASAGO MASARU
分类号 G03G5/00;G03F7/00 主分类号 G03G5/00
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