| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor tester generating a clock different from a reference clock without using a variable delay circuit. SOLUTION: The semiconductor tester generating a desired clock period and supplying a prescribed pattern to a testing object includes a phase shift means: (12) shifting the reference clock with a fixed period by a unit not larger than the fixed period; an index means (22) combining the reference clock shifted by the unit not larger than the fixed period and a unit not larger than the desired clock period to select the reference clock matching with the desired clock period; and the frequency dividing means (16) generating the desired clock period using the selected reference clock. COPYRIGHT: (C)2008,JPO&INPIT
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