发明名称 MEASURING SHAPE OF SPECULAR OBJECTS BY LOCAL PROJECTION OF CODED PATTERNS
摘要 The shape of a specular object is measured by illumination of the object by a light field generated by two or more spaced apart layers controllable to display multiple patterns that are predetermined relative to a bounding volume within which the object is positioned. The patterns code a sparse subset of the multitude of light rays that can be generated by the layers to those that can actually reach the bounding volume. A process is described by which a sparse coding of the light rays can be derived.
申请公布号 US2016349046(A1) 申请公布日期 2016.12.01
申请号 US201615151388 申请日期 2016.05.10
申请人 CANON KABUSHIKI KAISHA 发明人 TIN SIU-KEI;YE JINWEI
分类号 G01B11/25;G06K9/52;G06K9/46 主分类号 G01B11/25
代理机构 代理人
主权项 1. A method of measuring shape of a specular object, the method comprising: positioning the object within a bounding volume at an inspection station; illuminating the object with an illumination field generated by two or more spaced apart liquid crystal layers with largely overlapping fields of view, wherein each liquid crystal layer is controlled to display multiple binary patterns in synchronization with each other layer, and wherein the multiple binary patterns are predetermined for the bounding volume such that relative to a large multitude of light rays in the illumination field, the multiple binary patterns code a sparse subset of the multitude of light rays that can reach the bounding volume; capturing one or more images of the object under the illumination field; and recovering the shape of the object using the captured one or more images.
地址 Tokyo JP