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发明名称
TEST PREPARED RF INTEGRATED CIRCUIT
摘要
申请公布号
EP1866658(B1)
申请公布日期
2009.01.07
申请号
EP20060727743
申请日期
2006.03.27
申请人
NXP B.V.
发明人
VAUCHER, CICERO S.
分类号
G01R31/317;G01R31/28
主分类号
G01R31/317
代理机构
代理人
主权项
地址
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