System and method to decode data subject to a disturb condition

摘要

A method includes initiating a first decode operation of data at an error correction code (ECC) hard bit decoder in a data storage device that includes a controller and a memory. The method further includes, in response to the first decode operation indicating that the data is uncorrectable by the first decode operation, identifying one or more bits of the data that correspond to a disturb condition test pattern, changing a value of the one or more identified bits of the data to generate modified data, and initiating a second decode operation at the ECC hard bit decoder using the modified data.

主权项

1. A method comprising:
in a data storage device including a controller, a memory, and a second memory, performing, by the controller:
storing, into the second memory, data read from a first word line of the memory during a first read operation;initiating a first decode operation of the data at an error correction code (ECC) hard bit decoder; andin response to the first decode operation initiated at the ECC hard bit decoder indicating that the data is uncorrectable by the first decode operation:
identifying one or more bits of the data that correspond to a disturb condition test pattern, wherein the disturb condition test pattern is based at least in part on a state of one or more neighbor cells to a particular cell that stores the one or more identified bits;changing a value of the one or more identified bits of the data stored in the second memory to generate first modified data in the second memory; andinitiating a second decode operation at the ECC hard bit decoder using the first modified data; andin response to the second decode operation indicating that the first modified data is uncorrectable by the second decode operation:
initiating a second read operation of a second word line of the memory to determine second states of one or more cells of the second word line;identifying a second bit of the data that corresponds to a second disturb condition test pattern based on at least one state of the second states; andchanging a value of the second bit of the data to generate second modified data.