发明名称 FERROELECTRIC STACKED-LAYER STRUCTURE, FIELD EFFECT TRANSISTOR, AND FERROELECTRIC CAPACITOR AND FABRICATION METHODS THEREOF
摘要 A ferroelectric stacked-layer structure is fabricated by forming a first polycrystalline ferroelectric film on a polycrystalline or amorphous substrate, and after planarizing a surface of the first ferroelectric film, laminating on the first ferroelectric film a second thin ferroelectric film having the same crystalline structure as the first ferroelectric film. A field effect transistor or a ferroelectric capacitor includes the ferroelectric stacked-layer structure as a gate insulating film or a capacitor film.
申请公布号 US2009152607(A1) 申请公布日期 2009.06.18
申请号 US20080328275 申请日期 2008.12.04
申请人 TANAKA HIROYUKI;KATO YOSHIHISA;KANEKO YUKIHIRO 发明人 TANAKA HIROYUKI;KATO YOSHIHISA;KANEKO YUKIHIRO
分类号 H01L29/78;B32B9/00;H01G4/06;H01L21/04 主分类号 H01L29/78
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