发明名称 Polymer Compound, Positive Resist Composition and Process for Forming Resist Pattern
摘要 The positive resist composition of the present invention is a polymer compound comprising at least one constituent unit (a1) selected from the group consisting of constituent units represented by the following general formulas (1) and (1)', a constituent unit (a2) derived from an (alpha-lower alkyl)acrylate ester having a lactone-containing monocycle or a polycyclic group, and a constituent unit (a3) which is a constituent unit other than the constituent unit (a1) and the constituent unit (a2) and is derived from an (alpha-lower alkyl)acrylate ester which has an aliphatic cyclic group-containing non-acid dissociable dissolution inhibiting group and does not have a polar group: wherein R represents a hydrogen atom, a fluorine atom, a lower alkyl group having 20 or less carbon atoms, or a fluorinated lower alkyl group having 20 or less carbon atoms, R<SUP>1 </SUP>represents at most 20-membered cyclic group which may have a substituent, n represents 0 or an integer of 1 to 5, and m represents 0 or 1.
申请公布号 US2008096126(A1) 申请公布日期 2008.04.24
申请号 US20050570761 申请日期 2005.06.10
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 KINOSHITA YOHEI;IWAI TAKESHI
分类号 G03F7/20;C08F220/26;C08F220/28;C08G63/08;G03F7/039;H01L21/027 主分类号 G03F7/20
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