发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
The present disclosure provides a semiconductor device including a substrate, a first active region, a second active region, and a gate structure. The first active region and the second active region are disposed in the substrate. The gate structure includes a bottom, a first sidewall attached to the first active region, and a second sidewall attached to the second active region. The first sidewall and the bottom have a first point of intersection, and the first sidewall and a first horizontal line starting from the first point toward the substrate have a first included angle. The second sidewall and the bottom have a second point of intersection, and the second sidewall and a second horizontal line starting from the second point toward the substrate have a second included angle. The first included angle is different from the second included angle. A method for manufacturing a semiconductor device is provided herein. |
申请公布号 |
US2016372475(A1) |
申请公布日期 |
2016.12.22 |
申请号 |
US201514745464 |
申请日期 |
2015.06.21 |
申请人 |
Inotera Memories, Inc. |
发明人 |
WU Tieh-Chiang |
分类号 |
H01L27/108;H01L29/06;H01L29/423;H01L29/417;H01L29/78;H01L29/66 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a substrate; a first active region and a second active region disposed in the substrate, wherein the first active region is a source electrode, the second active region is a drain electrode, and a depth of the source electrode is greater than a depth of the drain electrode; and a gate structure disposed in the substrate and between the first active region and the second active region, and the gate structure comprising:
a bottom;a first sidewall attached to the first active region, the first sidewall and the bottom having a first point of intersection, and the first sidewall and a first horizontal line starting from the first point toward the substrate having a first included angle; anda second sidewall attached to the second active region, the second sidewall and the bottom having a second point of intersection, and the second sidewall and a second horizontal line starting from the second point toward the substrate having a second included angle,wherein the first included angle is different from the second included angle. |
地址 |
Taoyuan City TW |