发明名称 RESIST COMPOSITION
摘要 <P>PROBLEM TO BE SOLVED: To provide a resist composition with which a pattern having excellent line width roughness(LWR) can be obtained. <P>SOLUTION: A resist composition comprises: a polymer having a structural unit expressed by the formula(I); a resin which has an acid labile group, and which is insoluble or hardly soluble in an alkali aqueous solution and can become soluble in an alkali aqueous solution by an action of an acid; and an acid generator. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012088467(A) 申请公布日期 2012.05.10
申请号 JP20100234213 申请日期 2010.10.19
申请人 SUMITOMO CHEMICAL CO LTD 发明人 MASUYAMA TATSURO;YAMAMOTO SATOSHI
分类号 G03F7/039;C08F20/36;C09K3/00;G03F7/004 主分类号 G03F7/039
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