| 摘要 |
PURPOSE: A test circuit and a test system including the same are provided to perform a test operation by sensing a start point and a finish point of a program in the outside based on an internal signal. CONSTITUTION: A program state sensing unit(100) generates a program idle signal based on a plurality of internal program activation signals. A bypass circuit(200) outputs one of an output signal and a timing output signal to a data output pad based on the program idle signal and a test mode signal.
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