| 摘要 |
PROBLEM TO BE SOLVED: To reduce variation in precision of a timer function of a semiconductor device having variable resistance. SOLUTION: The semiconductor device includes: a first reference cell 44 in which the rate of change in a resistance value varying with time is a first rate of change; a second reference cell 46 in which the rate of change in the resistance value varying with time is a second rate of change different from the first rate of change; and a determination circuit 48 which determines whether a period from the reference time to the evaluation time exceeds a predetermined period on the basis of an amount related to the difference between a variation in the resistance value of the first reference cell 44 at the evaluation time from the reference time and a variation in the resistance value of the second reference cell 46 at the evaluation time from the reference time. COPYRIGHT: (C)2010,JPO&INPIT |
