发明名称 Semiconductor memory device layout comprising high impurity well tap areas for supplying well voltages to NWELLS and PWELLS
摘要 A semiconductor device includes a plurality of memory cells, and an error-correction circuit. Its write operation is performed by a late-write method, and ECC processing is executed in parallel with writing to shorten a cycle time. Moreover, when a memory cell is power-supplied through a well tap, the same address is not assigned while the memory cell is power-supplied through the well tap.
申请公布号 US2008094869(A1) 申请公布日期 2008.04.24
申请号 US20070000135 申请日期 2007.12.10
申请人 HITACHI ULSI SYSTEMS CO., LTD. 发明人 OSADA KENICHI;KAWAHARA TAKAYUKI;YAMAGUCHI KEN;SAITO YOSHIKAZU;KITAI NAOKI
分类号 G11C5/02;G11C11/413;G06F11/10;G11C7/22;G11C7/24;G11C29/00;G11C29/42;H01L21/8244;H01L27/10;H01L27/11 主分类号 G11C5/02
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