| 发明名称 |
Wavelength Calibration for Refractometers |
| 摘要 |
Calibration device for calibrating an operation wavelength characteristic of a refractometer for determining an information which is indicative for a refractive index of the sample, wherein the calibration device comprises an itself traceably calibratable determination unit, which is preferably at least partially external of the refractometer, which is adapted for determining an information which is indicative for a discrepancy between a pre-givable set-point-operation wavelength characteristic and an actual-operation wavelength characteristic of the refractometer, on whose basis the refractometer is calibratable. |
| 申请公布号 |
US2016320297(A1) |
申请公布日期 |
2016.11.03 |
| 申请号 |
US201615141092 |
申请日期 |
2016.04.28 |
| 申请人 |
Anton Paar OptoTec GmbH |
发明人 |
Ostermeyer Martin |
| 分类号 |
G01N21/41;G01N21/45 |
主分类号 |
G01N21/41 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. Calibration device for calibrating an operation wavelength characteristic of a refractometer for determining an information which is indicative for a refractive index of a sample, wherein the calibration device comprises:
a determination unit which itself is traceably calibratable and which is preferably at least partially external of the refractometer, which determination unit is adapted for determining an information which is indicative for a discrepancy between a pre-givable set-point-operation wavelength characteristic and an actual-operation wavelength characteristic of the refractometer, on the basis of which information the refractometer is calibratable. |
| 地址 |
Seelze-Letter DE |
