发明名称 半導体装置
摘要 PROBLEM TO BE SOLVED: To suppress an increase in a reverse leakage current even when a connector is connected to a semiconductor device through a solder electrode.SOLUTION: A semiconductor device 1 comprises: a semiconductor substrate 2; a cathode region 3 provided so as to extend from a principal surface 2a of the semiconductor substrate 2 to a predetermined depth; a drift region 4 provided so as to extend from the principal surface 2b and reach the cathode region 3; a plurality of trench regions 5 provided so as to extend from the principal surface 2b to a direction toward an inside of the semiconductor substrate 2; a barrier metal layer 9 provided on the principal surface 2b so as to cover an active region 8 including an exposed surface 5a of the plural trench regions 5 and forming a Schottky junction with the drift region 4; an anode electrode layer 10 provided on the barrier metal layer 9; a solder removing portion 11 which is provided on the side of the principal surface 2b and formed so as to prevent adhesion of solder; and a solder electrode 12 provided in a solder electrode formation region 10a partitioned by the solder exclusion portion 11 on an upper surface of the anode electrode layer 10.
申请公布号 JP6045971(B2) 申请公布日期 2016.12.14
申请号 JP20130088648 申请日期 2013.04.19
申请人 新電元工業株式会社 发明人 木村 拓;末本 竜二
分类号 H01L21/3205;H01L21/60;H01L21/768;H01L23/522 主分类号 H01L21/3205
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