| 摘要 |
An apparatus and method are disclosed for detecting flaws in electrically conductive materials by observing properties of the back-EMF of the eddy current field generated by driving magnetic flux through the object to be examined. The input signal may include sweeps at several frequencies, and may do so at one time under the principle of wave superposition. The sectorial observations of eddy currents summations may be compared to a known datum for a defect free material, the presence of anomalies in eddy field back EMF divergence tending to provide an indication of an irregularity in the underlying eddy field, and hence in the underlying material itself. The portable unit may have a number of different configurations depending on the nature of the object to be examined, be it a flat or large radius plate, a flange, a rail, or some other structural element. |
