发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>A semiconductor device and manufacturing method thereof are provided to suppress the warpage caused by the wire bonding. The electrode terminal(106) is arranged in the supporting body(101). The intermediate member is mounted on the supporting body. A part of the semiconductor device is supported by the intermediate member. The semiconductor device is arranged on the supporting body. The block shaped member is arranged on the supporting body or the intermediate member. The electrode terminal on the electrode terminal of the semiconductor device and the supporting body are connected to the bonding wire(109).</p>
申请公布号 KR20090023183(A) 申请公布日期 2009.03.04
申请号 KR20080083747 申请日期 2008.08.27
申请人 FUJITSU MICROELECTRONICS LIMITED 发明人 NISHIMURA TAKAO
分类号 H01L21/60 主分类号 H01L21/60
代理机构 代理人
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