| 摘要 |
<p>A testing apparatus for testing devices to be tested is provided with a pattern generating section for inputting a test pattern into a device to be tested; a judging section for judging conformity of the device, based on an output signal from the device; a power supply for supplying the device with power; a load fluctuation compensation circuit for generating a compensation current corresponding to fluctuation of a consumption current, within a set current range by a previously set gradient, so as to compensate fluctuation of a power supply voltage to be applied to the device; and a setting section for detecting a fluctuation quantity of the power supply voltage in the case where the test pattern is inputted into the device, and setting the current range in the load fluctuation compensation circuit, based on the detected fluctuation quantity.</p> |
