发明名称 Atomic layer deposition (ALD) method and reactor for producing a high quality layer
摘要 One inventive aspect is related to an atomic layer deposition (ALD) method comprising: a) providing a semiconductor substrate in a reactor, b) providing a pulse of a first precursor gas into the reactor at a first temperature, c) providing a first pulse of a second precursor gas into the reactor at a second temperature, and d) providing a second pulse of the second precursor gas at a third temperature lower than the second temperature. Another inventive aspect relates to a reactor suitable to apply the method.
申请公布号 US2006286810(A1) 申请公布日期 2006.12.21
申请号 US20060444132 申请日期 2006.05.31
申请人 DELABIE ANNELIES;CAYMAX MATTY 发明人 DELABIE ANNELIES;CAYMAX MATTY
分类号 C23C16/00;H01L21/31 主分类号 C23C16/00
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