| 发明名称 |
TESTER FOR INTEGRATED CIRCUITS ON A SILICON WAFER AND INTEGRATED CIRCUIT |
| 摘要 |
A tester for integrated circuits on a silicon wafer may include an input/output connection for testing an integrated circuit and circuitry causing the tester to perform: transferring a data frame to the integrated circuit via the input/output connection, the data frame including a time reference for the data included in the data frame, a field for validating the time reference and a data field including at least one integrated-circuit test command; and receiving a data frame via the input/output connection, the data in the data frame received having a duration that is a multiple of the time reference. |
| 申请公布号 |
US2016259002(A1) |
申请公布日期 |
2016.09.08 |
| 申请号 |
US201615057662 |
申请日期 |
2016.03.01 |
| 申请人 |
STARCHIP |
发明人 |
LAMBERT Cyrille;BAYON Sébastien;CROGUENNEC Alexandre |
| 分类号 |
G01R31/3177 |
主分类号 |
G01R31/3177 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A tester for integrated circuits on a silicon wafer, wherein the tester comprises;,
a single input/output connection for testing an integrated circuit; and circuitry causing the tester to perform:
transferring a data frame to the integrated circuit via the input/output connection, the data frame comprising a time reference for the data included in the data frame, a field for validating the time reference and a data field comprising at least one integrated-circuit test command; andreceiving a data frame via the input/output connection, the data in the data frame received having a duration equal to an integer number that is a multiple of the time reference and greater than or equal to twice the duration of the time reference. |
| 地址 |
Meyreuil FR |
