发明名称 MULTILAYER MIRROR
摘要 A multilayer mirror for reflecting extreme ultraviolet (EUV) radiation, the mirror has a substrate and a stack of layers formed on the substrate. The stack of layers comprises layers including a low index material and a high index material, the low index material having a lower real part of the refractive index than the high index material at a given operating wavelength λ. The mirror provides a first peak of reflectivity of 20% or more at a first wavelength λ1 in a first wavelength band extending from 6 nm to 7 nm and a second peak of reflectivity of 20% or more at a second wavelength λ2 in a second wavelength band extending from 12.5 nm to 15 nm.
申请公布号 US2016202396(A1) 申请公布日期 2016.07.14
申请号 US201615078105 申请日期 2016.03.23
申请人 Carl Zeiss SMT GmbH 发明人 GOEHNERMEIER Aksel;VON BLANCKENHAGEN Gisela
分类号 G02B5/08;G03F7/20;G21K1/06 主分类号 G02B5/08
代理机构 代理人
主权项 1. A multilayer mirror configured to reflect extreme ultraviolet (EUV) radiation, the mirror comprising: a substrate; and a stack of layers formed on the substrate, wherein the stack of layers comprises layers comprising a low index material and a high index material, the low index material having a lower real part of the refractive index than the high index material at a given operating wavelength λ, and wherein the mirror provides a first peak of reflectivity of at least 20% at a first wavelength λ1 in a first wavelength band extending from 6 nm to 7 nm and a second peak of reflectivity of at least 20% at a second wavelength λ2 in a second wavelength band extending from 12.5 nm to 15 nm.
地址 Oberkochen DE