发明名称 |
MULTILAYER MIRROR |
摘要 |
A multilayer mirror for reflecting extreme ultraviolet (EUV) radiation, the mirror has a substrate and a stack of layers formed on the substrate. The stack of layers comprises layers including a low index material and a high index material, the low index material having a lower real part of the refractive index than the high index material at a given operating wavelength λ. The mirror provides a first peak of reflectivity of 20% or more at a first wavelength λ1 in a first wavelength band extending from 6 nm to 7 nm and a second peak of reflectivity of 20% or more at a second wavelength λ2 in a second wavelength band extending from 12.5 nm to 15 nm. |
申请公布号 |
US2016202396(A1) |
申请公布日期 |
2016.07.14 |
申请号 |
US201615078105 |
申请日期 |
2016.03.23 |
申请人 |
Carl Zeiss SMT GmbH |
发明人 |
GOEHNERMEIER Aksel;VON BLANCKENHAGEN Gisela |
分类号 |
G02B5/08;G03F7/20;G21K1/06 |
主分类号 |
G02B5/08 |
代理机构 |
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代理人 |
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主权项 |
1. A multilayer mirror configured to reflect extreme ultraviolet (EUV) radiation, the mirror comprising:
a substrate; and a stack of layers formed on the substrate, wherein the stack of layers comprises layers comprising a low index material and a high index material, the low index material having a lower real part of the refractive index than the high index material at a given operating wavelength λ, and wherein the mirror provides a first peak of reflectivity of at least 20% at a first wavelength λ1 in a first wavelength band extending from 6 nm to 7 nm and a second peak of reflectivity of at least 20% at a second wavelength λ2 in a second wavelength band extending from 12.5 nm to 15 nm. |
地址 |
Oberkochen DE |