ON-CHIP BUILT-IN TEST AND OPERATIONAL QUALIFICATION

摘要

Operational and functional testing of the optical Physical Media Dependent Integrated Circuits (“PMD ICs”) is achieved by constructing a switchable on-chip load with similar or equivalent electrical characteristics of a targeted photonic device.

主权项

1. An on-chip built-in test and qualification system comprising:
a driver device for driving a device, wherein the device is associated with a current characteristic and a voltage characteristic (“I-V characteristic”); a load circuit designed to exhibit the I-V characteristic of the device; and a switch coupled between the driver device and the load circuit, such that the switch allows selection of one of either the driver device driving the device or the load circuit, wherein the switch may be activated during operational qualification of the driver device.