发明名称 FAST PHASE PROCESSING OF OFF-AXIS INTERFEROGRAMS
摘要 Techniques for extracting phase data of off-axis interferogram images are disclosed. At least one sample-related interferogram image associated with a sample is spectrally decomposed to obtain a set of frequency components thereof, and a portion of the set of frequency components is used to generate at least one complex image having a reduced size being smaller in size than the sample-related interferogram image and being indicative of the phase data of the at least one sample-related interferogram image. The reduced size complex image is then used to generate a phase image of the least one sample-related interferogram image.
申请公布号 US2016290782(A1) 申请公布日期 2016.10.06
申请号 US201615089691 申请日期 2016.04.04
申请人 Ramot at Tel-Aviv University Ltd. 发明人 GIRSHOVITZ Pinhas;SHAKED Natan Tzvi
分类号 G01B9/021;G01B11/26 主分类号 G01B9/021
代理机构 代理人
主权项 1. A computer-implemented method of extracting phase data of off-axis interferogram images, the method comprising: (i) receiving at least one sample-related interferogram image associated with a sample; (ii) performing spectral decomposition to said at least one sample-related interferogram image to obtain a set of frequency components thereof; (iii) generating from a portion of said set of frequency components at least one complex image having a reduced size being smaller in size than said sample-related interferogram image and being indicative of said phase data; (iv) using said reduced size complex image to generate a phase image of said least one sample-related interferogram image.
地址 Tel Aviv IL