发明名称 |
FAST PHASE PROCESSING OF OFF-AXIS INTERFEROGRAMS |
摘要 |
Techniques for extracting phase data of off-axis interferogram images are disclosed. At least one sample-related interferogram image associated with a sample is spectrally decomposed to obtain a set of frequency components thereof, and a portion of the set of frequency components is used to generate at least one complex image having a reduced size being smaller in size than the sample-related interferogram image and being indicative of the phase data of the at least one sample-related interferogram image. The reduced size complex image is then used to generate a phase image of the least one sample-related interferogram image. |
申请公布号 |
US2016290782(A1) |
申请公布日期 |
2016.10.06 |
申请号 |
US201615089691 |
申请日期 |
2016.04.04 |
申请人 |
Ramot at Tel-Aviv University Ltd. |
发明人 |
GIRSHOVITZ Pinhas;SHAKED Natan Tzvi |
分类号 |
G01B9/021;G01B11/26 |
主分类号 |
G01B9/021 |
代理机构 |
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代理人 |
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主权项 |
1. A computer-implemented method of extracting phase data of off-axis interferogram images, the method comprising:
(i) receiving at least one sample-related interferogram image associated with a sample; (ii) performing spectral decomposition to said at least one sample-related interferogram image to obtain a set of frequency components thereof; (iii) generating from a portion of said set of frequency components at least one complex image having a reduced size being smaller in size than said sample-related interferogram image and being indicative of said phase data; (iv) using said reduced size complex image to generate a phase image of said least one sample-related interferogram image. |
地址 |
Tel Aviv IL |