发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
The present disclosure relates to a semiconductor device including an oxygen gettering layer between a group III-V compound semiconductor layer and a dielectric layer, and a method of fabricating the semiconductor device. The semiconductor device may include a compound semiconductor layer; a dielectric layer disposed on the compound semiconductor layer; and an oxygen gettering layer interposed between the compound semiconductor layer and the dielectric layer. The oxygen gettering layer includes a material having a higher oxygen affinity than a material of the compound semiconductor layer. |
申请公布号 |
US2016172450(A1) |
申请公布日期 |
2016.06.16 |
申请号 |
US201615050867 |
申请日期 |
2016.02.23 |
申请人 |
LEE Dong-soo;LEE Myoung-jae;CHO Seong-ho;UDDIN Mohammad Rakib;SEO David;YANG Moon-seung;LEE Sang-moon;LEE Sung-hun;HUR Ji-hyun;HWANG Eui-chul |
发明人 |
LEE Dong-soo;LEE Myoung-jae;CHO Seong-ho;UDDIN Mohammad Rakib;SEO David;YANG Moon-seung;LEE Sang-moon;LEE Sung-hun;HUR Ji-hyun;HWANG Eui-chul |
分类号 |
H01L29/34;H01L21/322 |
主分类号 |
H01L29/34 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a compound semiconductor layer comprising at least one element from Groups III through VI; a dielectric layer disposed on the compound semiconductor layer; an oxygen gettering layer interposed between the compound semiconductor layer and the dielectric layer, the oxygen gettering layer comprising a material having a higher affinity for oxygen than a material of the compound semiconductor layer; and a passivation layer interposed between the compound semiconductor layer and the oxygen gettering layer, the passivation layer comprising at least one of S, N, F, Cl, and H formed on a surface of the compound semiconductor layer. |
地址 |
Gunpo-si KR |