发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
摘要 The present disclosure relates to a semiconductor device including an oxygen gettering layer between a group III-V compound semiconductor layer and a dielectric layer, and a method of fabricating the semiconductor device. The semiconductor device may include a compound semiconductor layer; a dielectric layer disposed on the compound semiconductor layer; and an oxygen gettering layer interposed between the compound semiconductor layer and the dielectric layer. The oxygen gettering layer includes a material having a higher oxygen affinity than a material of the compound semiconductor layer.
申请公布号 US2016172450(A1) 申请公布日期 2016.06.16
申请号 US201615050867 申请日期 2016.02.23
申请人 LEE Dong-soo;LEE Myoung-jae;CHO Seong-ho;UDDIN Mohammad Rakib;SEO David;YANG Moon-seung;LEE Sang-moon;LEE Sung-hun;HUR Ji-hyun;HWANG Eui-chul 发明人 LEE Dong-soo;LEE Myoung-jae;CHO Seong-ho;UDDIN Mohammad Rakib;SEO David;YANG Moon-seung;LEE Sang-moon;LEE Sung-hun;HUR Ji-hyun;HWANG Eui-chul
分类号 H01L29/34;H01L21/322 主分类号 H01L29/34
代理机构 代理人
主权项 1. A semiconductor device comprising: a compound semiconductor layer comprising at least one element from Groups III through VI; a dielectric layer disposed on the compound semiconductor layer; an oxygen gettering layer interposed between the compound semiconductor layer and the dielectric layer, the oxygen gettering layer comprising a material having a higher affinity for oxygen than a material of the compound semiconductor layer; and a passivation layer interposed between the compound semiconductor layer and the oxygen gettering layer, the passivation layer comprising at least one of S, N, F, Cl, and H formed on a surface of the compound semiconductor layer.
地址 Gunpo-si KR