发明名称 DEVICE FOR DETECTING ADJUSTMENT OF GAP BETWEEN UPPER ELECTRODE AND LOWER ELECTRODE IN ETCHING EQUIPMENT
摘要 An apparatus for detecting the horizontality of a gap between electrodes in etching equipment is provided to generate a selective alarm by automatically measuring an interval of the gap between upper and lower electrodes in every process of a wafer and by detecting whether the measured interval of the gap falls within a tolerance range. A lower electrode(30) is fixed to a lower floating base(36) which selectively inserts the lower electrode to a chamber. The lower floating base that reciprocates vertically is supported by a lower fixing base. A plurality of sensors(S1,S2,S3) measure an interval between the lower electrode and an upper electrode(13), fixed to the upper surface of the lower fixing base. A monitoring apparatus gives an alarm to an operator according as the sensor measures the interval of the gap between the upper and the lower electrodes and transmits a control signal for stopping the operation of the entire apparatus. Three sensors can be installed in positions having equal intervals of 120 degrees.
申请公布号 KR100742126(B1) 申请公布日期 2007.07.18
申请号 KR20060079283 申请日期 2006.08.22
申请人 S-BIZ CO., LTD. 发明人 LEE, KANG MAN;EOM, JUNG DAE;BAE, YOON SEUNG;KIM, JIN YOUNG;LEE, GIL KWANG
分类号 H01L21/3065 主分类号 H01L21/3065
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