发明名称 |
DEVICE FOR DETECTING ADJUSTMENT OF GAP BETWEEN UPPER ELECTRODE AND LOWER ELECTRODE IN ETCHING EQUIPMENT |
摘要 |
An apparatus for detecting the horizontality of a gap between electrodes in etching equipment is provided to generate a selective alarm by automatically measuring an interval of the gap between upper and lower electrodes in every process of a wafer and by detecting whether the measured interval of the gap falls within a tolerance range. A lower electrode(30) is fixed to a lower floating base(36) which selectively inserts the lower electrode to a chamber. The lower floating base that reciprocates vertically is supported by a lower fixing base. A plurality of sensors(S1,S2,S3) measure an interval between the lower electrode and an upper electrode(13), fixed to the upper surface of the lower fixing base. A monitoring apparatus gives an alarm to an operator according as the sensor measures the interval of the gap between the upper and the lower electrodes and transmits a control signal for stopping the operation of the entire apparatus. Three sensors can be installed in positions having equal intervals of 120 degrees.
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申请公布号 |
KR100742126(B1) |
申请公布日期 |
2007.07.18 |
申请号 |
KR20060079283 |
申请日期 |
2006.08.22 |
申请人 |
S-BIZ CO., LTD. |
发明人 |
LEE, KANG MAN;EOM, JUNG DAE;BAE, YOON SEUNG;KIM, JIN YOUNG;LEE, GIL KWANG |
分类号 |
H01L21/3065 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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