发明名称 |
INTEGRATED CIRCUIT, METHOD OF TESTING INTEGRATED CIRCUIT AND METHOD OF MANUFACTURING INTEGRATED CIRCUIT |
摘要 |
A spiral conductor pattern is formed on an insulating film over an integrated circuit chip. One end of the pattern is connected to an input and output terminal of a test circuit. The test circuit has input and output circuits that include a transmitting circuit for driving the conductor pattern as an induction coil or an antenna to transmit a signal, and a receiving circuit for detecting the changes in current or voltage of the conductor pattern to discriminate an external signal to the induction coil or the antenna. Data is transferred to and from an external control device in noncontact manner.
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申请公布号 |
WO02063675(A1) |
申请公布日期 |
2002.08.15 |
申请号 |
WO2001JP00756 |
申请日期 |
2001.02.02 |
申请人 |
HITACHI, LTD.;HISHINUMA, MASAYOSHI;SATOH, MASAYUKI |
发明人 |
HISHINUMA, MASAYOSHI;SATOH, MASAYUKI |
分类号 |
H01L23/58;(IPC1-7):H01L21/66 |
主分类号 |
H01L23/58 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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