发明名称 SEMICONDUCTOR MANUFACTURING APPARATUS AND SEMICONDUCTOR MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To perform heat treatment by a simple structure in a short time without reducing the throughput of an apparatus even if a treatment temperature difference exists between successively heat-treated semiconductor wafers. SOLUTION: The apparatus and the method for manufacturing semiconductor can carry out the heat treatment by the simple structure in a short time without reducing the throughput of the apparatus even if the treatment temperature difference exists between successively heat-treated semiconductor wafers by comprising a chamber for heat-treating the semiconductor wafer, a heat source for heating the semiconductor wafer, supporting pins on which the semiconductor wafer is mounted, and a vertically movable cover installed above the supporting pins. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007242850(A) 申请公布日期 2007.09.20
申请号 JP20060062585 申请日期 2006.03.08
申请人 NEC CORP 发明人 SHINOZAKI TSUTOMU
分类号 H01L21/22;H01L21/324 主分类号 H01L21/22
代理机构 代理人
主权项
地址