发明名称 DEFECT INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To achieve a defect inspection device which can obtain the same image shift amount in all cameras without enlarging the device even if a plurality of cameras are used. SOLUTION: The defect inspection device processes image information in which each target area divided into a plurality of areas is photographed by a plurality of cameras with lens systems and area sensors which is consisted of a predetermined number of pixels, and discriminates defect of the areas based on a calculated feature quantity, The detection inspection device is provided with a camera board which fixedly arranges the plurality of the cameras, and an actuator means which periodically moves in a predetermined range in X, Y directions. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008098968(A) 申请公布日期 2008.04.24
申请号 JP20060278361 申请日期 2006.10.12
申请人 YOKOGAWA ELECTRIC CORP 发明人 SENDA NAOMICHI;ISHIBASHI MASAHIRO;TAKAHASHI MAMORU
分类号 H04N5/225;G01M11/00;G01N21/88;G02F1/13;G06T1/00 主分类号 H04N5/225
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