发明名称 MRAM ARCHITECTURES FOR INCREASED WRITE SELECTIVITY
摘要 MRAM architectures are disclosed that produce an increased write margin and write selectivity without significantly reducing the packing density of the memory. The major axes (122) of the magneto-resistive bits (100a, 100b, 100c, etc.) are offset relative to the axes of the digital lines (110a, 100b, etc.) to produce a magnetic field component (124) from the digital line current (132a, 132b, etc.) that extends along the major axis (122) magneto-resistive bits (100a, 100b, 100c, etc).
申请公布号 WO0207166(A3) 申请公布日期 2002.07.18
申请号 WO2001US21962 申请日期 2001.07.12
申请人 MICRON TECHNOLOGY, INC. 发明人 LI, SHAOPING;ZHU, THEODORE;ARROT, ANTHONY, S.;LIU, HARRY;LARSON, WILLIAM, L.;LU, YONG
分类号 G11C11/15;G11C11/16;H01L21/8246;H01L27/105;H01L27/22;H01L43/08 主分类号 G11C11/15
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