发明名称 Multi-patterning lithography aware cell placement in integrated circuit design
摘要 A method, system, and computer program product for multi-patterning lithography (MPL) aware cell placement in integrated circuit (IC) design are provided in the illustrative embodiments. A global phase of cell movement is performed. A local phase cell movement is performed, wherein the local phase includes moving a color instance of the cell from a plurality of color instances of the cell within a row of cell in the IC design, wherein the global phase and the local phase are each performed before a final placement is produced for the IC design.
申请公布号 US8495548(B2) 申请公布日期 2013.07.23
申请号 US201113248711 申请日期 2011.09.29
申请人 AGARWAL KANAK BEHARI;ALPERT CHARLES JAY;LI ZHUO;NAM GI-JOON;VISWANATHAN NATARAJAN;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 AGARWAL KANAK BEHARI;ALPERT CHARLES JAY;LI ZHUO;NAM GI-JOON;VISWANATHAN NATARAJAN
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项
地址