发明名称 DEFECT DETECTOR AND DEFECT DETECTION METHOD
摘要 A defect detector and a defect detection method are provided to display a reference image which is compared with an image of a test board. An image display system and a maintaining element for maintaining a test object are provided. An image obtaining element picks up an image of the test object maintained by the maintaining element in order to obtain test image data(404) obtained by picking up an image of a defect region of the test object. The first display control element displays the test image data at the first display magnification on the image display system. The second display control element displays master image data(405) at the second display magnification on the image display system so that the master image data can be compared with the defect region, wherein the second display magnification is calculated in response to the first display magnification.
申请公布号 KR20050028847(A) 申请公布日期 2005.03.23
申请号 KR20040074607 申请日期 2004.09.17
申请人 DAINIPPON SCREEN SEIJO K.K 发明人 SANDA, AKIO
分类号 G01B11/30;G01N21/956;H04N17/00;H05K3/00;(IPC1-7):H04N17/00 主分类号 G01B11/30
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