发明名称 MAGNETIC TUNNEL JUNCTION STRUCTURE FOR MRAM DEVICE
摘要 A magnetic tunnel junction stack is provided that includes nonmagnetic spacer layers between the free layer and the polarizer layer formed from magnesium oxide and tantalum nitride materials that balance the spin torques acting on the free layer. The design provided enables a deterministic final state for the storage layer and significantly improves the tunneling magnetoresistance value and switching characteristics of the magnetic tunnel junction for MRAM applications.
申请公布号 US2016218278(A1) 申请公布日期 2016.07.28
申请号 US201615093367 申请日期 2016.04.07
申请人 SPIN TRANSFER TECHNOLOGIES, INC. 发明人 PINARBASI Mustafa;Kardasz Bartek
分类号 H01L43/08;G11C11/16;H01L43/10;H01L43/02 主分类号 H01L43/08
代理机构 代理人
主权项 1. A memory array comprising: at least one bit cell including: an antiferromagnetic structure including a reference layer;a barrier layer disposed over the reference layer;a free layer having a free layer magnetization direction disposed on the barrier layer, the reference layer, the barrier layer and the free layer forming a magnetic tunnel junction;a nonmagnetic spacer layer disposed on the free layer;a polarizer disposed on the magnetic spacer layer, the polarizer layer having a magnetization direction that is perpendicular to the free layer magnetization direction,wherein the nonmagnetic spacer layer is disposed between the free layer of the magnetic tunnel junction and the polarizer, the nonmagnetic spacer layer comprising a thin layer of magnesium oxide (MgO) on the free layer and a layer of tantalum nitride (TaN) capping material on the thin layer of MgO.
地址 Fremont CA US