Determining Transient Error Functional Masking And Propagation Probabilities

摘要

A method, system and product for determining transient error functional masking and propagation probabilities. An Error Infliction Probability of pair of nodes (source and destination) is representative of a Transient Error happening on a source node propagating to the destination node. The probability is computed by simulating a propagation of a transient error for plurality of cycles in a given trace. The simulation utilizes values from the trace for nodes that are not influenced by the error (but may influence its propagation). A plurality of cycle-simulations may be performed and a ratio of a number of times the transient error propagated to the destination node compared to a number of cycles examined may be used to compute the error infliction probability.

主权项

1. A computer-implemented method comprising:
obtaining a representation of a circuit, wherein the circuit comprises nodes, wherein the nodes comprise at least one source-node and one destination-node; obtaining a trace, wherein the trace comprises recorded values of the nodes in a plurality of cycles; determining, by a processor, an Error Infliction Probability (EPP) of a pair of nodes, the pair comprising a source-node and a destination-node, wherein the EPP is a value representing a probability that a Transient Error (TE) happening on the source-node propagating to the destination-node in the same clock cycle it happened, wherein said determining comprises simulating a propagation of the TE from the source-node to the destination-node for plurality of cycles in the trace, wherein said simulating in each cycle utilizes values from the trace for nodes that are not influenced by the error but may influence its propagation, wherein the EPP is calculated as N/M, where N is the number of times the error propagated to destination-node, and M is the number of cycles examined; and outputting the EPP of the node.