发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 It is an object to provide a highly reliable semiconductor device including a thin film transistor with stable electric characteristics. In a semiconductor device including an inverted staggered thin film transistor whose semiconductor layer is an oxide semiconductor layer, a buffer layer is provided over the oxide semiconductor layer. The buffer layer is in contact with a channel formation region of the semiconductor layer and source and drain electrode layers. A film of the buffer layer has resistance distribution. A region provided over the channel formation region of the semiconductor layer has lower electrical conductivity than the channel formation region of the semiconductor layer, and a region in contact with the source and drain electrode layers has higher electrical conductivity than the channel formation region of the semiconductor layer.
申请公布号 US2016204269(A1) 申请公布日期 2016.07.14
申请号 US201615074245 申请日期 2016.03.18
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 SAKATA Junichiro;HIROHASHI Takuya;KISHIDA Hideyuki
分类号 H01L29/786;H01L29/423;H01L29/49;H01L29/417 主分类号 H01L29/786
代理机构 代理人
主权项 1. (canceled)
地址 Atsugi-shi JP