发明名称 |
SEMICONDUCTOR DEVICE, MEASUREMENT INSTRUMENT AND CORRECTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device, a measurement instrument and a correction method, which can correct an error of an oscillation frequency caused by a temperature of an oscillator with high accuracy.SOLUTION: A semiconductor device comprises: an oscillator 28 oscillating at a natural frequency; a semiconductor integrated circuit 30 in which a temperature sensor 58 for detecting an ambient temperature and a control part 60 which is electrically connected to the oscillator 28 for correcting an error depending on a temperature of the oscillator 28 on the basis of a temperature detected by the temperature sensor 58 are integrated; and an encapsulation part for integrally encapsulating the oscillator 28 and the semiconductor integrated circuit 30. |
申请公布号 |
JP2013232545(A) |
申请公布日期 |
2013.11.14 |
申请号 |
JP20120104075 |
申请日期 |
2012.04.27 |
申请人 |
LAPIS SEMICONDUCTOR CO LTD |
发明人 |
YAMADA KAZUYA;SONE NORIHISA;TAKEI AKIHIRO;YOSHIDA YUICHI;TAKEMASA KENGO |
分类号 |
H01L21/822;G01R22/00;G04G3/02;H01L21/66;H01L23/29;H01L23/31;H01L23/50;H01L25/00;H01L27/04;H01L41/09;H01L41/18 |
主分类号 |
H01L21/822 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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