发明名称 SEMICONDUCTOR DEVICE, MEASUREMENT INSTRUMENT AND CORRECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device, a measurement instrument and a correction method, which can correct an error of an oscillation frequency caused by a temperature of an oscillator with high accuracy.SOLUTION: A semiconductor device comprises: an oscillator 28 oscillating at a natural frequency; a semiconductor integrated circuit 30 in which a temperature sensor 58 for detecting an ambient temperature and a control part 60 which is electrically connected to the oscillator 28 for correcting an error depending on a temperature of the oscillator 28 on the basis of a temperature detected by the temperature sensor 58 are integrated; and an encapsulation part for integrally encapsulating the oscillator 28 and the semiconductor integrated circuit 30.
申请公布号 JP2013232545(A) 申请公布日期 2013.11.14
申请号 JP20120104075 申请日期 2012.04.27
申请人 LAPIS SEMICONDUCTOR CO LTD 发明人 YAMADA KAZUYA;SONE NORIHISA;TAKEI AKIHIRO;YOSHIDA YUICHI;TAKEMASA KENGO
分类号 H01L21/822;G01R22/00;G04G3/02;H01L21/66;H01L23/29;H01L23/31;H01L23/50;H01L25/00;H01L27/04;H01L41/09;H01L41/18 主分类号 H01L21/822
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