发明名称 RF RECEIVER WITH TESTING CAPABILITY
摘要 An RF receiver device includes a semiconductor chip in a chip package, and a test signal generator integrated in the chip. The test signal generator generates an RF test signal including first information. An RF receiver circuit integrated in the chip receives an RF input signal, down-converts the RF input signal into an intermediate frequency (IF) or base band, and digitizes the down-converted signal to obtain a digital signal. An RF receive channel includes a coupler having first and second input ports and an output port. The output port is coupled to the input of the RF receiver circuit, the first input port receives an antenna signal and the second input port receives the test signal from the test signal generator. A signal processor is integrated in the chip and determines, during a test cycle, whether the first information in the digital signal matches a predetermined criterion.
申请公布号 US2016233969(A1) 申请公布日期 2016.08.11
申请号 US201615099130 申请日期 2016.04.14
申请人 Infineon Technologies AG 发明人 Kordik Klemens;Stuhlberger Rainer
分类号 H04B17/00;H04L7/00;H04B17/14;H04B17/29 主分类号 H04B17/00
代理机构 代理人
主权项 1. An RF receiver device, comprising: a test signal generator configured to generate an RF test signal including first information; an RF receive channel including an RF receiver circuit having an input configured to receive an RF input signal, and further configured to down-convert the RF input signal into an intermediate frequency (IF) or base band and to digitize the down-converted RF input signal, thus providing a digital signal; wherein the RF receive channel further comprises circuitry configured to receive an antenna signal and the RF test signal and provide the RF input signal to the RF receive channel; and a signal processor configured to determine, during a test cycle, whether the first information present in the digital signal matches a predetermined criterion.
地址 Neubiberg DE