发明名称 |
METHOD FOR TESTING RAMBUS MEMORY |
摘要 |
PURPOSE: A method for testing a Rambus memory is provided, which realizes an environment causing noise to a channel, and realizes a specific memory signal under a mounted environment at will, and calculates an accurate memory position and memory access automatically when there is a fail. CONSTITUTION: According to the method for testing a Rambus memory device having a channel of a packet constituted in 8-burst type of 2 byte, 32-bit data of an equal pattern is written/read repetitively to/from all memories of the Rambus memory device. And upper 16 bits and lower 16 bits are exchanged complementarily, to be toggled as "01010101" on a time axis as to one data output pad.
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申请公布号 |
KR20020060340(A) |
申请公布日期 |
2002.07.18 |
申请号 |
KR20010001364 |
申请日期 |
2001.01.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO, SEONG RAE;JIN, GWAN YONG;KIM, DO GEUN |
分类号 |
G11C29/00;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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