发明名称 METHOD FOR TESTING RAMBUS MEMORY
摘要 PURPOSE: A method for testing a Rambus memory is provided, which realizes an environment causing noise to a channel, and realizes a specific memory signal under a mounted environment at will, and calculates an accurate memory position and memory access automatically when there is a fail. CONSTITUTION: According to the method for testing a Rambus memory device having a channel of a packet constituted in 8-burst type of 2 byte, 32-bit data of an equal pattern is written/read repetitively to/from all memories of the Rambus memory device. And upper 16 bits and lower 16 bits are exchanged complementarily, to be toggled as "01010101" on a time axis as to one data output pad.
申请公布号 KR20020060340(A) 申请公布日期 2002.07.18
申请号 KR20010001364 申请日期 2001.01.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, SEONG RAE;JIN, GWAN YONG;KIM, DO GEUN
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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